<PAGE>
UNITED STATES SECURITIES AND EXCHANGE COMMISSION
Washington, D.C. 20549
- --------------------------------------------------------------------------------
FORM 8-K
CURRENT REPORT
PURSUANT TO SECTION 13 OR 15(d) OF THE SECURITIES EXCHANGE ACT OF 1934
March 25, 1997
Date of Report (Date of earliest event reported)
- --------------------------------------------------------------------------------
INTEGRATED MEASUREMENT SYSTEMS, INC.
(Exact name of registrant as specified in its charter)
OREGON 93-0840631
(State or other jurisdiction of (I.R.S. Employer Identification No.)
incorporation or organization)
Commission File No. 0-26274
9525 S.W. GEMINI DRIVE, BEAVERTON OR 97008
(Address of principal executive officers) (zip code)
REGISTRANT'S TELEPHONE NUMBER, INCLUDING AREA CODE: (503) 626-7117
- --------------------------------------------------------------------------------
<PAGE>
ITEM 5. OTHER EVENTS
Press Releases
IMS Introduces The eXtended Digital Test Station (XTS) Featuring 576 Pins
At IMS' Traditional Low Cost
On March 25, 1997, Integrated Measurement Systems, Inc. announced the
introduction of a new Test Station that extends the maximum pin count
of the ATS-Trademark- Advanced Digital Test Station series to a new
high of 576 I/O pins. Full text is attached to this report as
Exhibit 99a.
IMS Announces New Digital Virtual Test Solution for Mixed-Signal
On March 31, 1997, Integrated Measurement Systems, Inc. introduced
TestDirect-Trademark-, a new digital Virtual Test productivity tool
for mixed-signal test. Full text is attached to this report as
Exhibit 99b.
IMS Introduces High Speed E Series Data Modules Bringing Higher
Price/Performance Standards to its ATS-Trademark-, XTS-Trademark- and
MSTS-Trademark- Test Stations
On April 2, 1997, Integrated Measurement Systems, Inc. announced
the introduction of two new e-series data modules designated the
100e for 100 MHz operation and 200e for 200 MHz operation.
Developed for use with the ATS-Trademark-, XTS-Trademark- and
MSTS-Trademark- Test Stations, the new higher speed e-modules build
upon the 60e price/performance standard announced at ITC, 1996.
Full text is attached to this report as Exhibit 99c.
ITEM 6. EXHIBITS
(exhibit reference numbers refer to Item 601 of Regulation S-K)
99a. Press Release -- IMS Introduces The eXtended Digital Test Station
(XTS) Featuring 576 Pins At IMS' Traditional Low Cost
99b. Press Release -- IMS Announces New Digital Virtual Test Solution for
Mixed-Signal
99c. Press Release -- IMS Introduces High Speed E Series Data Modules
Bringing Higher Price/Performance Standards to its ATS-Trademark-,
XTS-Trademark- and MSTS-Trademark- Test Stations
<PAGE>
SIGNATURES
Pursuant to the requirements of the Securities Exchange Act of 1934, the
Registrant has duly caused this report to be signed on its behalf by the
undersigned thereunto duly authorized on April 16, 1997.
INTEGRATED MEASUREMENT SYSTEMS, INC.
(Registrant)
/s/ Sar Ramadan
---------------------------------
Sar Ramadan
Chief Financial Officer
<PAGE>
EXHIBIT 99a
PRESS RELEASE
IMS INTRODUCES THE EXTENDED DIGITAL TEST STATION (XTS)
FEATURING 576 PINS AT IMS' TRADITIONAL LOW COST
IMS' NEW EXTENDED DIGITAL TEST STATION, A NEXT GENERATION, HIGHER PIN
COUNT VERSION OF THE ADVANCED DIGITAL TEST STATION (ATS), SETS A RECORD
LOW COST FOR 100 MHZ, 512 PIN TEST STATIONS AT UNDER $2,500 PER PIN.
Beaverton, Oregon. -- March 25, 1997 -- Integrated Measurement Systems, Inc.
(NASDAQ:IMSC) today announced the introduction of a new Test Station that
extends the maximum pin count of the ATS-Trademark- Advanced Digital Test
Station series to a new high of 576 I/O pins. IMS has designated the new
system the eXtended Digital Test Station or XTS-Trademark-.
The XTS provides a full featured Test Station for testing complex devices such
as deep-submicron ASICs, microprocessors and MCMs with an unparalleled
combination of both high functionality and low cost per pin.
Higher Performance At A Lower Cost. "The market is demanding lower test costs
without sacrificing functionality or performance and IMS is committed to meeting
that need," commented Richard Gaunt, Marketing Manager for digital products at
IMS. "With the introduction of the XTS, customers needing to test high
performance, high pin count devices can benefit from the same cost reduction
that IMS provided with the recent introduction of the ATS60e. Full ATS
capabilities at 100 MHz for less than $2,500 per pin or 200 MHz at an extremely
attractive price are new targets our competitors will have difficulty in
matching."
Advanced Features. The XTS can be purchased with 100 MHz or 200 MHz performance
in either single timeset or multiple timeset FT (Flex-Time) versions, configured
with 512 I/O pins to 576 I/O pins, and up to 64 analog channels. The system
provides full ATS specifications for testing packaged devices of up to 760 pins
(576 I/O). It utilizes IMS "e series" data modules, including scan with up to 32
M of pattern depth. Analytic PMU, PMU per pin and any of IMS' software suites
are fully supported.
A fully configured systems is priced under $2,500 per pin. Key XTS features
include:
Seven bits of data behind every pin, allowing Realtime Compare and Acquire
for instant error detection and reporting.
Per pin programmable functions such as driver or dual comparator levels,
activeloads, variable slew rate, force and compare timing, tristate
and masking, and data formats.
Special Low Leakage Mode provides LESS THAN 250 nA of leakage current for
low current devices such as found in medical equipment or battery
operated devices.
Upgradable Performance. 100 MHz XTS Test Stations can be upgraded to 200 MHz
operation with no loss of initial investment in hardware, training or test
fixtures.
Timing-On-The-Fly. The XTS FT provides cycle switching, shrinking or
stretching of clock or data cycles on-the fly and independently programmable
clock channels providing up to 400 MHz clocks. The versatile time set
switching on-the-fly capability is controlled through Time Navigator IIOMEGA,
an interactive software environment that enables the XTS FT users to greatly
reduce the time it takes to identify and understand critical timing paths
within their devices.
Price and Availability. A fully configured 512 pin 100 MHz XTS Test Station is
priced under $2,500 per pin. XTS Test Stations are available for shipment
starting June, 1997.
Integrated Measurement Systems, Inc. (IMSC), is a worldwide leader in
engineering Test Stations and Virtual Test Software, providing cost-effective
solutions to reduce the time required to test and verify complex electronic
circuits. For the past three years, IMS has been rated #1 in pure test in the
VLSI Research Inc.'s Customer
<PAGE>
Satisfaction Survey List of 10 BEST Suppliers of Test and Material Handling
Equipment. IMS is listed on the NASDAQ National Market under the symbol IMSC.
For more information, contact IMS at 9525 S.W. Gemini Drive, Beaverton,
Oregon 97008. Ph: (503) 626-7117 or (800) 879-7117, Fax: (503) 644-6969 or
visit our Web site at www.ims.com.
ATS, XTS, Time Navigator II and the IMS logo are trademarks of Integrated
Measurement Systems, Inc.
<PAGE>
EXHIBIT 99b
PRESS RELEASE
IMS ANNOUNCES NEW DIGITAL VIRTUAL TEST SOLUTION FOR MIXED-SIGNAL
TESTDIRECT-TRADEMARK- TEST PATTERN GENERATION TOOL IMPROVES
TEST PRODUCTIVITY AND TIME-TO-MARKET
Beaverton, OR -- March 31, 1997 -- Integrated Measurement Systems, Inc.
(NASDAQ: IMSC) today introduced TestDirect-Trademark-, a new digital Virtual
Test productivity tool for mixed-signal test. TestDirect is a test pattern
generation program that provides test engineers with an automatic tool for
generating Automated Test Equipment (ATE) test patterns from the designer's
original testbench simulation environment. This process shortens the overall
product development cycle, increasing a customer's revenue potential and
improves their time-to-market competitiveness.
"TestDirect was designed for our mixed-signal customers who needed a digital
test pattern solution that is fast, direct, accurate and that does not
require a design methodology change," said Bob Harrison, Marketing Manager of
IMS' Virtual Test Division. "Because TestDirect automatically generates test
patterns from the original simulation environment, it simplifies this process
significantly, saving time and improving quality."
The TestDirect Process
TestDirect first documents the device behavior by using timing-diagram
waveforms. Using TestDirect, the test engineer graphically creates or imports
waveforms and automatically converts them into HDL "Watcher" code. This
Watcher' runs with the simulation of the design, monitoring the design
activity and creating cyclized patterns directly. TestDirect then combines
these patterns with the targeted tester waveform timing and formatting
information to generate the tester-specific test patterns.
Innovative Pattern Generation
TestDirect's innovative direct test pattern generation approach (patents
pending) eliminates the processing of large dump files and the multiple,
incremental refinement of databases. Intelligent Data Filtering-Trademark-
reduces the quantity of extracted data by selecting only the desired
simulation events, substantially improving test pattern development time.
Dynamic Pattern Cyclization-Trademark- generates correctly cyclized test
patterns through automatic monitoring of the design testbench. Matching
desired trigger events and timing data produces fully cyclized test pattern
data from the original designer's simulation environment. Dynamic Pattern
Cyclization automatically manages ambiguous edge placements, variable timing
and multiple case matching.
TestDirect does not change the designer's current design methodology, but
simply extends the use of simulation as a tool for the test engineer. This
common simulation usage improves communication between the design and test
team, and as it runs with any standard VHDL or Verilog simulator, it does not
require the use of a Programming Language Interface.
Works with Dantes-Trademark- for Complete Test Pattern Verification
TestDirect works with Dantes-Trademark-, the mixed-signal test development
system, to provide a complete test pattern verification capability, allowing
the test engineer to load the pattern and timing information into a tester
model and simulate the interaction between the patterns, the device model and
the tester models, resulting in very high confidence in the correctness of
the test patterns, a shorter debug cycle and improved time-to-market.
Designed for Mixed-Signal Applications
<PAGE>
TestDirect supports mixed-signal test through automatic insertion of tester
subroutine calls into the test program. Direct Call Insertion-Trademark- is a
unique process whereby tester subroutine calls are automatically inserted
into the generated test program at the appropriate locations to correctly
drive the tester for mixed-signal testing.
Price and Availability
TestDirect-Trademark- pricing starts at $35,000 and will be available on
April 30, 1997.
TestDirect will initially support:
Hewlett-Packard 9490, 9491, 9492, 9493, 9494, 9495
IMS MSTS FT
Teradyne A570, A580
About Virtual Test
TestDirect extends and builds upon IMS' lead in Virtual Test technology. Virtual
Test tools allow test engineers to create, optimize, simulate, debug and verify
test fixtures and device-test programs that run on ATE systems. Test engineers
use these tools early in the design process, concurrently with device design, to
speed test development, reducing time-to-market, reducing the cost of test, and
improving quality.
About Integrated Measurement Systems, Inc. (IMS)
IMS IS THE WORLDWIDE LEADER IN ENGINEERING TEST STATIONS AND VIRTUAL TEST
SOFTWARE, PROVIDING COST-EFFECTIVE SOLUTIONS TO REDUCE THE TIME REQUIRED TO TEST
AND VERIFY COMPLEX ELECTRONIC CIRCUITS. FOR THE PAST THREE YEARS, IMS HAS RATED
THE TOP TEST COMPANY IN THE VLSI RESEARCH CUSTOMER SURVEY FOR TEST AND MATERIAL
HANDLING COMPANIES. IMS IS LISTED ON THE NASDAQ NATIONAL MARKET UNDER THE SYMBOL
IMSC. FOR MORE INFORMATION, CONTACT IMS AT 9525 S.W. GEMINI DRIVE, BEAVERTON,
OREGON 97008. TELEPHONE: (503) 626-7117 OR (800) 879-7117 OR VISIT OUR WEB SITE
AT WWW.IMS.COM.
<PAGE>
EXHIBIT 99c
PRESS RELEASE
IMS INTRODUCES HIGH SPEED E-SERIES DATA MODULES
BRINGING HIGHERPRICE/PERFORMANCE STANDARDS
TO ITS ATS, XTS AND MSTS TEST STATIONS
100 MHZ AND 200 MHZ E-SERIES DATA MODULES WILL GIVE IMS CUSTOMERS HIGHER
FUNCTIONALITY AND PERFORMANCE AT A LOWER PRICE
Beaverton, Ore. -- April 3, 1997 -- Integrated Measurement Systems Inc today
announced introduction of two new e-series data modules designated the 100e
for 100 MHz operation and 200e for 200 MHz operation. Developed for use with
the ATS-Trademark-, XTS-Trademark- and MSTS-Trademark- Test Stations, the new
higher speed e-modules build upon the 60e price/performance standard
announced at ITC, 1996.
"Customers who test high performance, high pin count devices can realize a
greater savings in the cost of test as well as enhanced performance and
functionality with the e-series data modules," commented Richard Gaunt,
marketing manager for digital products at IMS.
E-Modules Build Upon Current Module Capabilities. Offering 16 I/O data
channels, the e-series modules contain all the capabilities of IMS' current data
modules with the addition of optional deeper pattern memory and a low leakage
current operation mode. Like the 60e, the 100e and 200e data modules utilize
advanced bipolar technology in the driver and comparator circuitry.
Advanced Features. IMS e-series data modules can be configured with 128K or
512K of local vector memory, and with 4 M or 8 M of dynamic pattern memory per
pin. Other key features include:
Seven bits of data behind every pin, allowing Realtime Compare and Acquire
for instant error detection and reporting.
Per pin programmable functions such as driver or dual comparator levels,
active loads, variable slew rate, force and compare timing, tristate
and masking, and data formats.
Special Low Leakage Mode provides LESS THAN 250 nA of leakage current for
low current devices such as found in medical equipment or battery
operated devices.
A DC PMU per pin is optional.
Versatility Across Entire IMS Test Station Series. E-series data modules can
be used in Advanced Test Station (ATS), eXtended Test Station (XTS) and
Mixed-Signal Test Station (MSTS) models. Configurations can range from 16 I/O
pins to 576 I/O pins with up to 64 high performance analog channels.
Different speed e-series data modules may be freely intermixed within any
Test Station and combined with SCAN data modules with up to 32 M of serial
memory. In addition, IMS Test Stations can be ordered with IMS' exclusive FT,
FlexTime-Trademark- option that provides time set switching on-the-fly,
independently programmable high speed clocks and easy to use Time Navigator
II-Trademark- software environment for critical timing path analysis.
Price and Availability. All e-series data modules are available today. A 100
MHz 512 pin system utilizing the 100e module is priced under $2,500 per pin
while 200 MHz systems are slightly higher.
Integrated Measurement Systems Inc. (IMSC), is a worldwide leader in engineering
Test Stations and Virtual Test Software, providing cost-effective solutions to
reduce the time required to test and verify complex electronic circuits. For the
past three years, IMS has been rated #1 in pure test in the VLSI Research Inc.'s
Customer Satisfaction Survey List of the 10 BEST Suppliers of Test and Material
Handling Equipment. IMS is listed on the NASDAQ National Market under the symbol
IMSC. For more information, contact IMS at 9525 S.W. Gemini Drive, Beaverton,
Oregon 97008. Ph: (503) 626-7117 or (800) 879-7117, Fax: (503) 644-6969 or visit
our Web site
<PAGE>
at www.ims.com
- -Trademark-ATS, XTS, MSTS, FlexTime, Time Navigator II and the IMS logo are
trademarks of Integrated Measurement Systems Inc.
